- Electronic Devices and Circuits - Section 1
- Electronic Devices and Circuits - Section 2
- Electronic Devices and Circuits - Section 3
- Electronic Devices and Circuits - Section 4
- Electronic Devices and Circuits - Section 5
- Electronic Devices and Circuits - Section 6
- Electronic Devices and Circuits - Section 7
- Electronic Devices and Circuits - Section 8
- Electronic Devices and Circuits - Section 9
- Electronic Devices and Circuits - Section 10
- Electronic Devices and Circuits - Section 11
- Electronic Devices and Circuits - Section 12
- Electronic Devices and Circuits - Section 13
- Electronic Devices and Circuits - Section 14
- Electronic Devices and Circuits - Section 15
- Electronic Devices and Circuits - Section 16


Electronic Devices and Circuits - Engineering
Q1: The phenomenon known as "Early effect" in a BJT refers to a reduction of the effective base width caused byA electron-hole recombination at the base
B reverse biasing of the base collector junction
C forward biasing of emitter base junction
D the early removal of stored base charge during saturation to cut off switching
ANS:B - reverse biasing of the base collector junction No answer description is available. |


For help Students Orientation
Mcqs Questions
One stop destination for examination, preparation, recruitment, and more. Specially designed online test to solve all your preparation worries. Go wherever you want to and practice whenever you want, using the online test platform.